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Topic: Recent Advances in Structural Characterisation Techniques and Their Applications to Materials Research

A special issue of Microstructures

ISSN 2770-2995 (Online)

Submission deadline: 15 Jun 2023

Guest Editor(s)

  • Assist. Prof. Zibin Chen
    Department of Industrial and Systems Engineering, The Hong Kong Polytechnic University, Hong Kong, China.

    Website | E-mail

  • Asst. Prof. Yuxuan (Kelvin) Xie
    Department of Materials Science and Engineering, Texas A&M University, TX, United States.

    Website | E-mail

  • Asst. Prof. Tao Yang
    Department of Materials Science and Engineering, City University of Hong Kong, Hong Kong, China.

    Website | E-mail

Special Issue Introduction

Dear Colleagues,
As we all know, the properties of materials are closely related to their microstructures. Understanding the microstructures of materials is, therefore, critical for designing materials with superior properties that meet the application requirements. With the development of materials characterisation technology, it is now possible to directly visualise microstructures from the micrometre scale to the atomic scale using methods including electron microscopy, scanning probe microscopy, X-ray diffraction, and atomic probe tomography. The development of state-of-the-art characterisation techniques has significantly advanced our understanding of the structure–property relationships of materials. Here we propose a Special Issue in Microstructures focusing on recent advances in characterisation techniques and their applications in materials research. Contributions in the form of review articles and research papers are all welcome, and the topics will include but are not limited to the following:
● Recent advances in electron microscopy, scanning probe microscopy, synchrotron radiation, and atomic probe tomography techniques and theory;
In-situ characterisation, property measurement and testing;
● Materials structural characterisation using state-of-the-art microscopy techniques.

Keywords

Characterisation, in-situ, electron microscopy, synchrotron radiation, scanning probe microscopy, atomic probe tomography, microstructures

Submission Deadline

15 Jun 2023

Submission Information

Articles of special issue are free of charge for article processing.
For Author Instructions, please refer to http://microstructj.com/pages/view/author_instructions
For Online Submission, please login at https://oaemesas.com/login?JournalId=M&IssueId=M230109
Submission Deadline: 15 Jun 2023
Contacts: Mengyu Liu, Assistant Editor, assistant_editor@microstructj.com

Published Articles

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