fig4

Figure 4. Simulated domain structures of (A) 0.45BiFeO₃-0.55SrTiO₃ and (B) 0.20BiFeO₃-0.25BaTiO₃-0.55SrTiO₃^[58]. (C) Simulated domain structure of BaTiO₃ and BiFeO₃ thin films under mismatch strains of 2% and -2%. Black and white colors represent domains with stronger out-of-plane polarization components, while other colors represent domains with stronger in-plane polarization components^[59]. (D) Free energy surfaces of BaTiO₃ and BiFeO₃ under mismatch strains of 2% and -2%, respectively^[59]. (E) Breakdown path in dielectrics with different grain sizes^[61]. (F) Local electric field distribution of virtual samples with different shell fractions under an external applied voltage of 200 V^[68]. (G) Finite element simulation of the distribution of stress and elastic energy density in a single layer of a multilayer ceramic capacitor^[72]. (H) Simulated development of electric trees in Ba_0.7Ca_0.3TiO₃/BaZr_0.2Ti_0.8O₃ multilayer films with different total thicknesses^[74]. (I) Simulated evolution of electric trees in BaZr_0.15Ti_0.85O₃/BaZr_0.35Ti_0.65O₃ multilayer films with different stacking periodic numbers (N)^[77].