fig19
Figure 19. (A) Scanning electron microscopy image showing deformation features around the tip of the main crack (labeled by C) in a Charpy V-notch sample after Ak testing at RT. (B) Close-up view showing the emission of SBs from the crack tip. Note the presence of a micro-void (labeled by v) on the advancing path of the SB[159]. SBs: Shear bands; RT: room temperature.
