fig14

Microstructural evolution and ferroelectricity in HfO<sub>2 </sub>films

Figure 14. Oxygenation and deoxygenation of HZO and associated phase transformations. (A) STEM-iDPC images under increasing positive bias showing R-phase evolution of an HZO grain. (B) Out-of-plane displacement of VO with external bias in the marked supercell (red box) with respect to the positions in (A). Negative values indicate displacement toward bottom electrode. VO shows both in-plane and out-of-plane (toward bottom electrode) components (inset). (C) A new grain nucleates in the same region at +4 V, giving rise to a polycrystalline nature (FFT in inset). (D) Another region in HZO film back at 0 V showing the O- and M-phases. Note the change of orientation from [111] to [100]. (E) STEM-iDPC image of domains (mutually rotated by 180° about [111]) in R-phase, which is retained when poled at -3 V (imaged at 0 V). Scale bars: 1 nm in (A, C, E), 2 nm in (D). Interfaces between HZO and top and bottom LSMO are marked in orange[30]. HZO: Hf0.5Zr0.5O2; STEM-iDPC: scanning transmission electron microscopy-integrated differential phase contrast; LSMO: La0.7Sr0.3MnO3.

Microstructures
ISSN 2770-2995 (Online)
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