fig3

Figure 3. (A) XRD patterns of converted product(s) obtained at different heating temperatures. The diffraction peaks were indexed based on the pseudocubic unit cell (pc) because of rhombohedral distortion. (B) Details of the XRD pattern in the 2θ ranges of 32.0°-33.0°, 39.5°-40.5° and 46.0°-47.0° for the product obtained at 1150 °C. The latter two peaks were fitted using the Gaussian function as examples. Morphological evolution during the Aurivillius BINT to perovskite 0.94BNT-0.06BT conversion process at different heating temperatures of (C) 900, (D) 1000, (E) 1050, (F) 1100 and (G) 1150 °C.