fig5

Figure 5. EBSD examination of samples after IA at 700 °C for 10 min: (A,D,G) WSA; (B,E,H) SA700; and (C,F,I) SA550. (A-C) The phase distribution overlapped with IQ map; (D-F) the phase distribution overlapped with grain boundary map, where the blue and orange lines represent the high (15°-180°) and low (2°-15°) angle boundaries, respectively; and (G-I) KAM mapping. EBSD: Electron backscattering diffraction; IA: intercritical annealing; SA: softening annealing; IQ: image quality; KAM: kernel average misorientation.