fig4

Figure 4. TEM characterization of the as-sintered CrMnFeCoNi (Cr1, x = 1) HEA. (A and B) are HAADF-STEM and corresponding bright-field TEM images; (C-E) are SAED patterns of the matrix, the grey precipitate and the black precipitate in (A), respectively. TEM: Transmission electron microscopy; HEA: high-entropy alloy; HAADF-STEM: high-angle annular dark-field scanning TEM; SAED: selected area electron diffraction.