fig2

Figure 2. Neutron diffraction patterns and Rietveld refinement results of the fluxed [(FeNiCo)_0.85Cr_0.15]_100-xB_x N-HEAs, with x = 17 (A), 15 (B), and 12 (C). (D) Illustration of image processing approach used to estimate the phase fractions; the left half shows the SEM image, and the right half displays the processed image used to calculate the phase fraction.