fig1

Crystallographic variant mapping using precession electron diffraction data

Figure 1. (A) VBF, (B) index, (C) reliability, and (D) orientation maps of the SMA sample. (E) VBF, (F) index, (G) reliability, and (H) orientation maps of the VO2 on sapphire sample. Note the reliability and orientation maps are noisy in both samples.

Microstructures
ISSN 2770-2995 (Online)
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