fig8

Crystallographic variant mapping using precession electron diffraction data

Figure 8. Crystallographic variant maps generated using the SMA dataset and the SSIM comparison method with (A) 0.705, (B) 0.732, (C) 0.751, (D) 0.769, (E) 0.778, and (F) 0.787 cut-off values.

Microstructures
ISSN 2770-2995 (Online)
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