fig4

Grain engineering of high energy density BaTiO<sub>3</sub> thick films integrated on Si

Figure 4. High-resolution TEM images near (A) BaTiO3/Pt and (B) BaTiO3/LaNiO3 interfaces in the unbuffered and buffered BaTiO3 film heterostructures, respectively. Insets are Fast-Fourier-Transformed (FFT) selected area electron diffraction (SAED) patterns of the local BaTiO3 film and its underneath LaNiO3 buffer layer.

Microstructures
ISSN 2770-2995 (Online)
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