fig4

Cryogenic atom probe tomography and its applications: a review

Figure 4. Micrographs from the cryogenic FIB lift-out process of a buried frozen water/solid interface: (A1) ROI trenching, (A2 and A3) lift-out, (A4) placing the lift-out bar on a silicon (Si) micropost, (A5) nano-welds by the re-deposition of the milled debris, (A6) detachment of the lift-out bar, and (A7) high-resolution image the cryo-specimen before annular milling. (B1) APT tip containing the interface of frozen water and corroded glass after annular milling, and (B2) the high-resolution image of (B1). Reproduced with the permission of Ref.[39] Copyright 2023, Elsevier.

Microstructures
ISSN 2770-2995 (Online)
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