Oxford Instruments Nanoanalysis, High Wycombe, United Kingdom
Patrick Trimby studied geology at Oxford University and completed his PhD in 1998 at the University of Liverpool in the UK, focusing on the application of the emerging technique of electron backscatter diffraction (EBSD) to the study of deformed rocks. Following a postdoctoral position at Utrecht University in the Netherlands, he worked for the next 10 years at HKL Technology in Denmark and subsequently Oxford Instruments in Sweden, before moving to the University of Sydney in Australia in 2010. During his time in Australia, Dr. Trimby played a prominent role in the development of Transmission Kikuchi Diffraction (TKD) and was involved in a wide range of microstructural research, ranging from atom probe tomography of meteorites to the characterisation of severely plastically deformed alloys in the scanning electron microscope. Since 2017, Dr. Trimby has been the EBSD Product Manager at Oxford Instruments Nanoanalysis in the UK and has overseen the launch of the world’s first CMOS-based EBSD detector, as well as multiple innovations in EBSD data processing techniques. Dr. Trimby has published more than 70 peer-reviewed articles and presented at international conferences across the world, often as a plenary / keynote speaker. He is constantly looking to continue the development of the EBSD technique and is routinely involved in multiple collaborative research projects with customers, spanning a wide range of applications from battery technologies to solar cell research and development.
Junior Executive Editor of Microstructures
Department of Industrial and Systems Engineering, The Hong Kong Polytechnic University, Hong Kong, China.